Abstract
A new, simple and comparatively precise method is proposed for the measurement of thin films of the order of a few μg/cm 2, which is based on the absorption of Mn K-Auger electrons emitted from 55Fe. Since this method gives the relative thickness, standard samples of independently known thickness are necessary to obtain absolute values. The apparatus consists essentially of a GM counter and an 55Fe source, situated on either side of a diaphragm which has a small aperture over which the specimen is set, and four holes for the flow of Q gas (He 99%, isobutane 1%) as counting gas. It takes 30 min per measurement including installation of the specimen and gas exchange. Vinyl or collodion films of 10 μg/cm 2 mass per unit area can be measured with 11% error.
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