Abstract
The symmetry of CBBD patterns provides a powerful means for determ'ning the crystal point groups and space groups. To obtain a useful CBED pattern, the angle of convergence of the electron beam must be large enough, but the diffraction discs must not overlap. A new method for obtaining non-overlapping large-angle CBED is proposed here. The principle of this method is equivalent to that proposed by Tanaka et al. Instead of shifting the specimen, the electron beam is defocused, thus retaining the eccentric height of the specimen. Hence the area of interest will not be lost when the specimen is tilted. Large-angle CBED patterns generated by a large electron probe (>2μm) may besdistorted, but they are useful.
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