Abstract
A new method to study secondary electron emission has been devised and secondary electron emission yield from Nd surface bombarded by Nd ions was measured in the energy range of 0.1–3 keV. A neodymium ion beam was extracted from a laser-ion source using resonance photoionization, and bombarded the surface which was continuously covered by Nd atoms. The variation in ion flux was calibrated by the reference ion signal. Secondary electron emission is not observed for energies below 0.97 keV. Above the threshold, secondary electron emission yield increases linearly with the incident ion energy and becomes 0.17 at 3 keV. These results indicate that by this method secondary electron emission yield can be measured from a laser-ion source even when a large incident ion flux variation is present.
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