A new measurement method and electrical design for high density optoelectronics integration

Abstract

This paper describes a parallel test method based on a cross-point switch which can be programmed to control signal path and the number of switches to be opened according to the number of channels to be tested. In this method, at the transmitting side, one source inputted cross-point switch can be fan-out to multi sources to activate device under test, and different signal trace or length of cables can change phases between multi sources. At the receiving side, all output channels are connected to another RF switch controlled to choose output channel. These two switches both are controlled by software. Multi channels working together will help evaluating cross talk between channels and SSN noise test. In this paper, to ensure test accuracy, signal integrity of DUT and test system is designed and simulated. And an 8-channel optical transceiver is tested using this method and cross talk and power noise are especially showed and analyzed. The test results indicate this test method can meet parallel optical transmission test requirement and other optical module and electrical module test; however the cost is greatly lower than high speed test instruments.