Abstract
The first characterization of the microwave dielectric properties of ZnZrTa2O8 ceramic is presented. Single phase ZnZrTa2O8 ceramics with wolframite structure were prepared by a conventional mixed-oxide route and sintered in the temperature range of 1280–1360°C. The microstructures and microwave dielectric properties were investigated systematically. The variation trend of εr was in accordance with that of relative density and molecular volume. The Q×f value was mainly depended on the atomic packing fraction. The τf was found to be correlated with the variation of bond valence of the A- and B-site cations. The ZnZrTa2O8 ceramic sintered at 1320°C for 6h exhibited excellent microwave dielectric properties of εr∼32, Q×f∼110,700GHz, and τf∼−32ppm/°C. This constitutes a very promising material for microwave applications.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
