Abstract
Rapid single flux quantum (RSFQ) circuits have the advantages of high speed and low power consumption. The typical frequency of the RSFQ circuits is tens of GHz. Therefore, it is necessary to reliably test the high-frequency performance of RSFQ circuits simply and effectively. This paper proposes a new on-chip high-frequency testing method, which uses pseudo-random sequences generated by linear feedback shift register (LFSR) as the test vectors, and the output shift registers (SRs) to store the last piece of high-frequency testing result and read out it at low-frequency. Unlike the traditional high-frequency demonstration method of using the Input/Output SRs, our testing system can automatically generate a large number of test vectors to test the circuit at high frequency at low cost, making the whole high-frequency demonstration more reliable and convincing. On the other hand, this method is also a feasible and straightforward on-chip high-frequency test method for various RSFQ circuits. This work verified the proposed method, and the highest test frequency can reach 54 GHz while the circuit shows good operating margins.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
