A new insight into largely defocused HAADF-STEM imaging and visualization of strain field

Abstract

A crystalline bilayer specimen with a semi-coherent interface can generate moiré fringes in the high-angle annular-dark field scanning transmission electron microscopy (HAADF-STEM) imaging. Moreover, when the probe is significantly defocused, this specimen can produce largely defocused probe (LDP)-STEM patterns. Although the electron channeling effect serves as the fundamental principles for HAADF-STEM imaging, its connection to the emergence of LDP-STEM patterns remains unclear. The missing link lies in identifying the location of the imaged region. To address this issue, we examined the strain field in three-dimensional space and its interaction with the convergent electron beam, taking the PbZrO3/SrTiO3 (PZO/STO) heterostructure as an example. We discovered a new intensity relationship for LDP-STEM patterns in the PZO/STO heterostructure, which can be well explained by our theory. We also found that, generated by imaging the strain zone, these patterns revealed information that might be obscured in traditional high resolution STEM images, showing a unique advantage in characterizing the strain field. Furthermore, we provided discussions on visualizing the strain field, including the misfit dislocation network and array. Our research offers a novel perspective on the LDP-STEM imaging and clarifies the approach to characterizing the strain field.