A new infrared sensor model based on imaging system parameters

Abstract

When infrared detection scene simulation, Target signature quantitative measurement, a high confidence sensor model should be developed. Generally, sensor model is developed by dividing an infrared sensor into three parts: optics, detector and electronic circuits. Then several Mathematics models describing those parts effect are developed, and a sensor model is integrated. In this way, the sensor model is based on strict mathematic theory. But this model needs a lot of parameters, some of which are very difficult to achieve. So this model have an advantage to analyze sensor model effect, and when to simulating Infrared detection scene or to analyzing quantitative measurement precision of faint target by actual infrared sensor, a sensor model which is based on parameters that can be achieved should be developed. This article presents a new sensor model. The input parameters includes: SiTF, MTF, Noise and so on, all of which can be achieved in laboratory or outfield. The sensor model is validated by point target experiment and four-bar target experiment, and the error is within 5%. The SiTF parameter can be achieved through the relation of blackbody radiation and sensor signal. The noise parameter can be achieved by nonuniform background sensor signal and SiTF. The MTF parameter is very important, but it is difficult to be measured directly, especially outfield. This article presents a method to inverse the MTF by point target observation experiment. This method can be used to inverse an actual sensor MTF outfield by star observation experiment.