Abstract

Scanning probe microscopy (SPM) analysis of materials is reliant upon direct physical interaction between a scanning probe and a sample surface. This physical interaction provides a range of analysis and surface modification techniques that are unique in microscopy and offers particular advantages and limitations. Precise computer-controlled positioning capabilities of SPM instrumentation continues to improve and is being combined with new nanoengineered probe types to achieve long-sought nanotechnology goals and minimize some of the traditional limitations of scanning probe technology.

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