Abstract
Large-area X-ray imaging is one of the most widely used imaging modalities that spans several scientific and technological fields. Currently, the direct X-ray conversion materials that are being commercially used for large-area (> 8 cm × 4 cm without tiling) flat panel applications, such as amorphous selenium (a-Se), have usable sensitivities of up to only 30 keV. Although there have been many promising candidates (such as polycrystalline HgI2 and CdTe), none of the semiconductors were able to assuage the requirement for high energy (> 40 keV) large-area X-ray imaging applications due to inadequate cost, manufacturability, and long-term performance metrics. In this study, we successfully demonstrate the potential of the hybrid Methylammonium lead iodide (MAPbI3) perovskite-based semiconductor detectors in satisfying all the requirements for its successful commercialization in synchrotron and medical imaging. This new generation of hybrid detectors demonstrates low dark current under electric fields needed for high sensitivity X-ray imaging applications. The detectors have a linear response to X-ray energy and applied bias, no polarization effects at a moderate bias, and signal stability over long usage durations. Also, these detectors have demonstrated a stable detection response under BNL’s National Synchrotron Light Source II (NSLS-II) 70 keV monochromatic synchrotron beamline.
Highlights
X-ray based imaging techniques are widely used in a wide range of applications
Amorphous selenium (a-Se) is the only direction conversion material used in commercial flat panel X-ray imagers (FPXIs)
Beyond 40 keV, the attenuation coefficient of amorphous selenium (a-Se) is lower than that of CsI by close to one order of magnitude, rendering a-Se direct conversion FPXIs impractical for chest and torso imaging as well as in any type of tomography applications that operate at energies > 40 keV
Summary
X-ray based imaging techniques are widely used in a wide range of applications. In particular, flat panel X-ray imagers (FPXIs) are widely used in digital radiography, fluoroscopy, digital tomosynthesis, image-guided radiation therapy, and cone beam computed tomography, and applications in non-medical fields such as nondestructive, cultural heritage investigations, metrology, materials science research, geophysics, and homeland security[1,2,3,4,5,6,7,8,9,10,11,12,13,14,15,16,17,18,19,20,21,22]. We will discuss the fabrication techniques and properties of the large-area MAPbI3-based X-ray detectors that are prime candidates for a new generation of direct FPXIs. The main target of this study was to develop X-ray detectors that can be reliably and reproducibly used for the applications mentioned above.
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