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Abstract
A new reflectometer system is developed for measuring the radiative characteristics of solid materials from a thermal engineering point of view. This system employs an ellipsoidal mirror in a simple optical alignment, and measures the spectrum of the normal-incident hemispherical reflectance in a wavelength region from 0.35 to 1.10μm. A single spectral scanning offers the hemispherical reflectance spectrum which completely covers both of the specular and diffuse components of reflection. The reflectance is directly interpreted into the absorptance for the normal incidence. The system also measures the angular dependence of reflection readily. The system is applied to a systematic study on the reflection characteristics of rough metallic surfaces. The predominant contribution of the specular component in the angular characteristics is demonstrated.
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