Abstract

For the practical nonlinear circuits, a number of new frequencies are generated in the output spectrum, which makes electromagnetic interference location quite challenging. To mitigate this problem, an approach is proposed to identify the electromagnetic emission source frequencies and nonlinear factors from the output spectrum of nonlinear circuits. The amplitude of the output spectrum with the input of two sine signals is first calculated based on the power series. Then, the Order Image (OI) is defined to reveal the output spectrum features, and its symmetry characteristic has been comprehensively analyzed. Results show that the maximum symmetry index is observed when the reference frequencies are equal to the excitation frequencies. Based on this observation, the electromagnetic emission source frequencies can be obtained. In addition, a Backward Algorithm (BA) has been introduced to extract nonlinear factors. The proposed approach only requires the output spectrum and the amplitude of one excitation. Compared with other techniques, like the Support Vector Machines and the Recurrent Neural Network, it needs much less prior information. Finally, several examples are carried out to verify the effectiveness of the proposed approach. Results show that the emission source frequencies and nonlinear factors can be accurately extracted. Therefore, the proposed approach shows great potential in electromagnetic interference location and characteristic analysis for nonlinear circuits.

Highlights

  • T HE integration intensity of electronic devices on a single platform keeps increasing with the development of new technologies

  • We find that the maximal symmetry index is observed when the reference frequencies are equal to the excitation frequencies

  • From the Forward Algorithm (FA), it is clear that the odd unions, where p + q is an odd integer, of the source frequencies in the output signal spectrum result from the odd order of nonlinear factors

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Summary

INTRODUCTION

T HE integration intensity of electronic devices on a single platform keeps increasing with the development of new technologies. In [10], an approach, named as the Basic Waveform Theory, is proposed for electromagnetic emission source identification from the output spectrum. The phase information may be missing due to the fundamental functionality limitations of instruments, like spectrum analyzer, in which no phase information is available To mitigate those problems, an approach is proposed to identify the electromagnetic emission source frequencies and nonlinear factors from the output spectrum of nonlinear circuits. For the multi-source input the nonlinear circuits, the order reduced process for emission frequency identification is introduced and has been verified in the fourth example. Due to the nonlinear effects in the power series, the spectrum of F (x) includes original frequencies of input signals and some new components.

OI OF SPECTRUM
50 Picked Spectrum
Findings
CONCLUSION
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