Abstract
A 4-circle diffractometer equipped with a novel imaging system has been installed at HASYLAB beamline G3. The imaging system comprising a microchannel plate (MCP) in front of a CCD detector allows position-resolved X-ray diffraction investigations of polycrystalline materials. Alternatively, a scintillation counter behind a Soller collimator can be used. Material properties like strain and/or texture can thus be determined either position resolved using the MCP/CCD system or in an averaging mode using the Soller/scintillator combination. The field of view of the MCP/CCD system is larger than 1 cm 2 with a spatial resolution down to 12 μm. Both detection systems applied are aberration free. The spatial information can be directly extracted from pictures taken by the imaging system. Together with the wide field of view this method is especially suited for the investigation of dynamical processes in polycrystalline materials.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
