Abstract
This paper suggests a data envelopment analysis (DEA) model for selecting the most efficient alternative in advanced manufacturing technology in the presence of both cardinal and ordinal data. The paper explains the problem of using an iterative method for finding the most efficient alternative and proposes a new DEA model without the need of solving a series of LPs. A numerical example illustrates the model, and an application in technology selection with multi-inputs/multi-outputs shows the usefulness of the proposed approach.
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