Abstract
The properties of a differential transconductance amplifier coupled with a four channel measurement system are exploited in order to reach a very high sensitivity in current noise measurements. In particular, it is demonstrated that, in proper conditions, the noise contributions coming from the active and passive devices that make up the transresistance amplifier can be virtually eliminated. Moreover, the proposed measurement method allows the evaluation of the impedance of the device under test from noise measurement data. Actual measurement results are also reported that demonstrate the effectiveness of the proposed approach.
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