Abstract
A new Macintosh TM-controlled microscope stage and digitizing tablet system has been developed that automates external detector method grain-to-mica matching, track length measurement, slide scanning, object centering, and file management within a single, well-integrated, user-friendly program environment. The system is based on a high-quality Kinetek TM aumated sanning stage that has found wide use in the microelectronics industry. A unique feature of the system is use of the digitizing tablet cursor to control most stage actions, resulting in a very intuitive and natural mode of operation, and faster and less tedious analysis of samples than with other automated systems.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
