A new combinatorial model for deterministic competing failure analysis

Abstract

AbstractComponents in many engineering and industrial systems can experience propagated failures, which not only cause the failure of the component itself but also affect other components, causing extensive damage to the entire system. However, in systems with functional dependence behavior where failure of a trigger component may cause other components (referred to as dependent components) to become unusable or inaccessible, failure propagation originating from a dependent component could be isolated if the corresponding trigger component fails first. Thus, a time‐domain competition exists between the failure propagation effect and the failure isolation effect, which poses a great challenge to the system reliability modeling and analysis. In this work, a new combinatorial model called competing binary decision diagram (CBDD) is proposed for the reliability analysis of systems subject to the competing failure behavior. In particular, special Boolean algebra rules and logic manipulation rules are developed for system CBDD model generation. The corresponding evaluation algorithm for the constructed CBDD model is also proposed. The proposed CBDD modeling method has no limitation on the type of component time‐to‐failure distributions. A memory system example and a network example are provided to demonstrate the application of the proposed model and algorithms. Correctness of the proposed method is verified using the Markov method.