Abstract
The M2 factor and other parameters often used in evaluating the beam quality of lasers are not sufficient. Based on the beam characteristics of semiconductor laser, the paper presents a new expression for the beam quality on semiconductor laser. The new beam quality factor can not only evaluate the beam quality of the semiconductor laser but also evaluate the beam quality of the semiconductor laser chips via collimating and focusing lenses. The results give us grounds to make the following conclusions: the new beam parameter product succeeds in its universality and adaptability in collimating and focusing lenses of a multi-emitter semiconductor laser made by stacking several signal emitter chips.
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