Abstract
Thin chromium films of thickness ranging from 25 to 80 nm are prepared by thermal evaporation under a vacuum of 1.33 × 10−3 Pa. The electrical resistivity was inversely proportional to the thickness of the film. The analysis of the electrical resistivity is treated in the frame of the effective mean free path theory of size effect developed by Pichard et al. Such analysis allows the determination of the mean free path l0, carrier concentration nc, relaxation time τ, and Fermi energy EF. The optical constants, n and k, of chromium thin films are determined in the spectral range of 200 to 25000 nm. The obtained results agree with the optical conductivities predicted theoretically by Moruzzi et al. In addition, the values of nc, σs, l0, and τ obtained electrically are found to match with those obtained optically.
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