Abstract
In this paper, a simple waveguide measurement technique is presented to determine the complex dielectric constant of a dielectric material. The dielectric sample is loaded in a short-circuited rectangular waveguide. Using a network analyzer, the reflection coefficient of the waveguide is measured. Using the finite-element method (FEM) the exact reflection coefficient of this configuration is determined as a function of the dielectric constant. The measured and calculated values of the reflection coefficient are then matched using the Newton-Raphson method to estimate the dielectric constant of a material. A comparison of estimated values of the dielectric constant obtained from simple waveguide modal theory and the FEM approach is presented. Numerical results for dielectric constants of Teflon and Plexiglas measured at the X- and Ku-bands are presented. Numerical inaccuracies in the estimate of the dielectric constant due to: 1) the presence of airgaps between sample and sample holder waveguide surfaces and 2) inaccuracy in the sample dimensions are also discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Microwave Theory and Techniques
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
