Abstract

The work described in this paper focuses on the utilisation of silicon nanowires as the information storage element in flash-type memory devices. Silicon nanostructures have attracted attention due to interesting electrical and optical properties, and their potential integration into electronic devices. A detailed investigation of the suitability of silicon nanowires as the charge storage medium in two-terminal non-volatile memory devices are presented in this report. The deposition of the silicon nanostructures was carried out at low temperatures (less than 400 °C) using a previously developed a novel method within our research group. Two-terminal non-volatile (2TNV) memory devices and metal-insulator-semiconductor (MIS) structures containing the silicon nanowires were fabricated and an in-depth study of their characteristics was carried out using current-voltage and capacitance techniques.

Highlights

  • The working principle of the 2TNV memory presented in this article is based on the model proposed by Paul, S. wherein the realisation of the non-volatile memory behaviour is attributed to the creation of an internal electric field when a voltage is applied across the device[11]

  • The research conducted in this paper was primarily concerned with the investigation of the SiNWs a charge storing component for future flash memory-type devices

  • The charging of SiNWs can be appealing to the community working in the area of Nanoscience

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Summary

Introduction

The working principle of the 2TNV memory presented in this article is based on the model proposed by Paul, S. wherein the realisation of the non-volatile memory behaviour is attributed to the creation of an internal (or surplus) electric field when a voltage is applied across the device[11]. The value of this electric field will define the difference between the two distinctive conductivity states[11]. Impurities and/or trapped charges may affect the performance and working mechanism of proposed device; an investigation has been undertaken to comprehend such influence on working of device, if any

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