Abstract
A theoretical method is described of using power reflection spectroscopy to detect the spectral properties of layers of molecular material on homogeneous or inhomogeneous solid substrates. Results are presented for non-reflective, partially reflecting and highly reflecting substrates at various angles of incidence in σ and π polarisation. At angles near the Brewster angle of the substrate the nature of the spectrum in pi polarisation is such that a spectral feature due to a surface layer only 1.0 Å thick is visible in the form of a small “blip” on a constant background. For non-metallic and metallic substrates the spectrum is extremely sensitive to the thickness of the liquid layer, polarisation, and angle of incidence, so much so that this method provides a large amount of new information per experiment, much more so than conventional absorption spectroscopy.
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