Abstract
Neutron spin echo resolved grazing incidence scattering (SERGIS) was used to probe crystallites of [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) produced by extensive thermal annealing of a poly(3-hexylthiophene-2,5-diyl)(P3HT):PCBM organic photovoltaic layer. After annealing a thin film of P3HT:PCBM, PCBM crystallites appear on the sample surface, and a strong SERGIS signal is observed superimposed on the specular reflection. Features in the data can be readily correlated with length scales of the crystallites determined using atomic force microscopy and indicate that in such cases the SERGIS signal may be interpreted as a form of small angle neutron scattering.
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