Abstract
A method to calculate the refractive-index profile of planar waveguides from near-field measurements is described. The method is based on a profile expansion in terms of orthonormal functions. Numerical simulations carried out on a symmetrical waveguide show that few-term expansions provide a satisfactory profile recovery. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 27: 197–201, 2000.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
