Abstract
We theoretically investigate an optimized tip-film system that supports in-situ measurement of tip-enhanced Raman spectroscopy (TERS) and tip-enhanced fluorescence (TEF) of dye molecules. A scanning tunneling microscope (STM) is proposed to precisely control the tip-film distance, and thus in-situ measurement of TERS and TEF can be realized utilizing the specific surface plasmon resonance (SPR) properties of the tip-film system. Our calculations show that the optimized tip-film distance of 2 nm suggests a possibility of efficient acquisition of TERS and TEF in-situ. The calculated spatial resolution of TERS and spectral resolution of TEF can be down to 6.5 nm and 10 nm, respectively. Our theoretical results may find promising application in developing multiple functional nano-spectroscopy through which Raman and fluorescence can be measured in-situ at the nanoscale level.
Highlights
Compared with the traditional SERS and SEF, tip-enhanced Raman spectroscopy (TERS)[17,18,19] and tip-enhanced fluorescence (TEF)[20,21,22] have the advantages of high spatial and spectral resolution, and the ability to manipulate a probe for varying parameters of experiment
The scanning tunneling microscope (STM) based TERS and TEF configurations were chosen as our research systems in which the tip-film distance can be precisely controlled
The TERS and TEF enhancements are highly sensitive to the tip-film distance
Summary
Compared with the traditional SERS and SEF, tip-enhanced Raman spectroscopy (TERS)[17,18,19] and tip-enhanced fluorescence (TEF)[20,21,22] have the advantages of high spatial and spectral resolution, and the ability to manipulate a probe for varying parameters of experiment. Due to the strong coupling property of the tip-film system, the enhanced EM can well suppress the quenching while the molecules are in the vicinity of tip, and results in a considerable enhancement of TEF. From the instrument design point of view, we will optimize the design of TERS and TEF configurations to realize the combination of TERS and TEF techniques which is of very importance to develop multiple functional nano-spectroscopy at the nanoscale level. If it is feasible, the in-situ precise measurements of TERS and TEF can come true. Our calculations show that in-situ measurements of TERS and TEF can be achieved by proper modeling
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