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Abstract
We report a novel material testing system (MTS) that uses hierarchical designs for in-situ mechanical characterization of multiscale materials. This MTS is adaptable for use in optical microscopes (OMs) and scanning electron microscopes (SEMs). The system consists of a microscale material testing module (m-MTM) and a nanoscale material testing module (n-MTM). The MTS can measure mechanical properties of materials with characteristic lengths ranging from millimeters to tens of nanometers, while load capacity can vary from several hundred micronewtons to several nanonewtons. The m-MTM is integrated using piezoelectric motors and piezoelectric stacks/tubes to form coarse and fine testing modules, with specimen length from millimeters to several micrometers, and displacement distances of 12 mm with 0.2 µm resolution for coarse level and 8 µm with 1 nm resolution for fine level. The n-MTM is fabricated using microelectromechanical system technology to form active and passive components and realizes material testing for specimen lengths ranging from several hundred micrometers to tens of nanometers. The system’s capabilities are demonstrated by in-situ OM and SEM testing of the system’s performance and mechanical properties measurements of carbon fibers and metallic microwires. In-situ multiscale deformation tests of Bacillus subtilis filaments are also presented.
Highlights
The development of micro- and nanoscale experimental mechanics has been driven by the need to evaluate the mechanical behavior of materials on small or specific scales
Because this system needs to work in a high vacuum environment and perform mechanical measurements with sample characteristic lengths ranging from a few millimeters to tens of nanometers, it is challenging to ensure the stability of the mechanical structure and solve the electromagnetic interference problem
In the optical microscopes (OMs), the noise can be divided into two types: ambient noise that comes from the air and from external vibration sources, and system noise that originates from mechanical motion, piezoelectric ceramic motion, creep and nonlinear motion
Summary
The development of micro- and nanoscale experimental mechanics has been driven by the need to evaluate the mechanical behavior of materials on small or specific scales. MEMS-based and probe-based techniques increasingly tend to be applied to smaller and smaller objects, and this is accompanied by dramatic shrinkage in the volumes of materials and the novel mechanical properties that are demonstrated at such greatly reduced scales The advantages of these approaches are that they can provide delicate equipment and achieve fine force and displacement measurements for samples with specific dimension requirements. The specialty of the system is embodied in the tensile testing of multiscale Bacillus subtilis (B. subtilis) filaments/threads We expect this hierarchical design to be useful in the study of the multiscale mechanical properties of other materials, and that the multifunctional features that combine the capabilities of miniature material testing machines and probe-based and MEMS-based testing devices will be suitable for manipulation, loading, and clamping of micro- and nanoscale materials in other areas
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