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Abstract
A multiple exposure X-ray spectrometer is described which has been constructed for measuring small changes in lattice spacing of crystals, resulting from various physicochemical operations. The instrument is suitable for both powder and single crystal photographs, and the specimen can be investigated either in vacuo, or in any desired gas. Various experimental errors which arise in determining the position of an X-ray reflexion can be directly evaluated on the spectrometer itself. Its use in measuring isotope effects in crystals is illustrated by typical X-ray spectra comparing CO(NH2)2 with CO(ND2)2 and KH2PO4 with KD2PO4.
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