Abstract
Measurements of anomalous small-angle X-ray scattering often include a strong fluorescent background. The separation of the elastic scattering from the background is usually performed at the time of analysis. This paper presents an alternative experimental method using a multilayer analyser compatible with a linear position-sensitive detector and, for a test case, compares the resulting structure factors with those obtained by the usual technique. The technique achieves the proposed goal but at the expense of counting rate.
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