A Multifixture Full-Wave De-Embedding Method for Characterizing One-Port Devices

Abstract

Full-wave de-embedding refers to a network de-embedding technique in which the fixture effects are removed by characterizing any connection interface using a full-wave EM simulation method instead of by measurement alone. This technique is able to achieve consistent definition of equivalent circuit voltage and current when the de-embedded results are used for EM/circuit cosimulation. Adopting this approach, we describe an improved full-wave de-embedding method for characterizing one-port devices, where multiple redundant fixtures with mutually complementary properties are used to minimize the effects of random errors. Based on a linearized error model, the proposed method is able to improve the de-embedding accuracy over a broad frequency range, particularly when the device under test is reconfigurable. The proposed method is verified through the de-embedding of a surface-mount p-i-n diode, for which numerical and experimental results are provided. We also compare our technique with the thru-reflect–line method, and the results show that full-wave de-embedding can be more reliable in developing device models for accurate EM/circuit cosimulation purposes.