Abstract
In this work, by using a post-thermal annealing method, a new morphological and structural evolution of triethylsilylethynyl anthradithiophene (TES-ADT) was observed for the first time. At lower annealing temperature (60–120 °C) sheet crystals were obtained, the sizes of which increased with the enhancement of the annealing temperature. A significant morphological transition from sheet crystals to rod-like crystals was observed when the annealing temperature approached the melting point of TES-ADT (about 130 °C). The in-plane lattice parameters were found to be different between the sheet crystals and the rod-like crystals. We thus attribute the mechanism for the morphological transition to the different thermostability of the crystals, which arises from the changeable lattice configuration. The electrical performances of TES-ADT film were improved through thermal annealing.
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