Abstract
A method of X-ray line-broadening analysis is presented whereby the coherence length and microstrain contributions can be calculated using a Monte Carlo interference-function-fitting algorithm. The method is based on the `column-like' crystal model and can be applied to both single and multiple-order reflections. Examples on simulated diffraction peaks, deformed face-centred-cubic palladium powder and heavily textured deformed body-centred-cubic low-carbon-steel sheets are presented and comparisons are made with currently applied methods.
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