Abstract
A Monte Carlo simulation of secondary electron emission from organic compounds has been developed. The number of secondary electrons generated in the specimen is determined parametrically and the energy of the secondary electrons is calculated using a simple electron excitation function, which is an approximate formula for the outer shell ionization. The cascade scattering process of the secondary electrons generated is included. The variation of secondary electron yield with the primary electron energy is calculated and the validity of the simulation is checked in comparison with the experimental data reported for several types of materials. A relatively good agreement is obtained between the calculated secondary yields and experimental ones.
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