A modeling tool for detector resolution and incomplete charge collection

Abstract

The detector response function of X‐ray and gamma‐ray detectors is obtained from the convolution of the energy deposition spectrum with the detector resolution function. The energy deposition spectrum can be computed by using deterministic or Monte Carlo codes, while the energy resolution depends specifically on the detection mechanism, which is characteristic of the single detector. In a first approximation, the energy resolution can be modeled using a normalized Gaussian distribution having its full width at half maximum expressed in terms of specific semiempirical formulas for solid‐state detectors, scintillators, and gas proportional counters. However, this approach is not sufficient with some solid‐state detectors. It is frequent to find that the peaks show a deviation from the Gaussian shape: a long flat shelf structure from the peak centroid to the lower energies and an asymmetry that can be described with an exponential decay on the left side of the peak. These two effects have been introduced in the new tool RESOLUTION by adapting empirical models found in literature. RESOLUTION can be tailored to the specific detector by analyzing measured monochromatic peaks by means of the following strategies: (1) in a first approximation, a Gaussian shape is assumed in order to determine the full width at half maximum parameters, (2) if it is noted a flat background on the left side of the peak, then a shelf function is added, and (3) if a departure of the Gaussian is observed, then an exponential tail function is added. RESOLUTION gives a very precise description of the line shape. Copyright © 2015 John Wiley & Sons, Ltd.