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Abstract
The equivalent source is a widely used approach for simulating hybrid electromagnetic (EM) field-circuit problems. In this approach, three techniques, e.g., the wire, surface, and volume structure, can be employed for embedding lumped circuits into finite difference time-domain cells. However, the volume structure technique introduced in previous studies may result in incorrect answers when addressing problems consisting of electronic devices loaded onto conductor strip gaps. To fix this problem, an extra processing method is proposed. Based on the condition of consistent potential on the same tangent plane in the loading direction, this approach assigns the EM field on the grids occupied by the lumped circuit to obtain the equivalent source information. A numerical example is presented, the structure of which consists of a Schottky diode mounted across a microstrip gap. The results validate the feasibility of the proposed method.
Highlights
INTRODUCTIONWith the increase in operating frequencies and integration densities, electronic circuit systems exhibit significant interactions between their electromagnetic (EM) structures (such as microstrip lines and vias) and lumped elements (such as semiconductor devices)
With the increase in operating frequencies and integration densities, electronic circuit systems exhibit significant interactions between their electromagnetic (EM) structures and lumped elements
The equivalent current source (ECS)-PER-VS approach described above can be used in some microstrip circuits, but it is not applicable to the circuit structure of a lumped circuit loaded between the conductor strip gaps, so extra processing is required
Summary
With the increase in operating frequencies and integration densities, electronic circuit systems exhibit significant interactions between their electromagnetic (EM) structures (such as microstrip lines and vias) and lumped elements (such as semiconductor devices) Their performances may be seriously distorted by parasitic currents and EM radiation from internal or external sources. In 1999, the ECS model was improved by Reddy and used the port voltage of the lumped circuit to update the electric field components of all FDTD grids on the surface where the active microwave circuit is located.9 This approach is equivalent to using ECS with a two-dimensional surface structure. For the case where the devices are loaded onto the conductor strip gap, the volume structure based on the equivalent source approach proposed in the previous literature may result in incorrect outputs. The hybrid EM field-circuit system (such as a microstrip circuit, consisting of a lumped circuit loaded between the conductor strip and the ground) can be solved directly by using the ECS-PER-VS approach
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