Abstract
A generic reflectometry is modelled as a device for launching and receiving radiation at a number of microwave frequencies, uniformly distributed over a specified bandwidth. The effect of density fluctuations is modelled as a phase error at each frequency. The phase distortion has a known correlation length in frequency space, allowing a semi-analytical prediction of the resultant error on the time delay. Specific techniques are compared to the generic model: frequency sweep, differential phase, AM and sine FM modulation. There is no significant difference between them and the model in their response to the same type of phase error. An implication of the model is that there are situations where profile details are unrecoverable by certain implementations of reflectometry on a short time scale. These arise when the phase fluctuations are strong and the phase correlation length short, conditions found in the plasma edge.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
