Abstract
Ballistic helium transport in tungsten during fuzz growth was investigated to provide insight into the helium-induced nanostructuring process which adversely affects the near-surface properties of tungsten plasma-facing components. An analytical model of helium ion transport in the vacuum region within the fuzz layer was developed, whereby He ions are assumed to move in straight-line trajectories with mean free paths determined from fuzz/nanotendril dimensions. Reflection of ions from tendril sides was considered, with He ions allowed to implant into the bulk at the base of the fuzz layer if they maintain ≥5eV of energy necessary to overcome the He-W surface barrier potential, resulting in an increase in the effective He mean free path. Using the model results for helium implantation in the bulk, a helium fluence-fuzz thickness relation was achieved, which matches well with experimental data in the literature, and implies that the fuzz growth rate is consistent with ballistic implantation into the bulk through the growing porous fuzz layer.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
