Abstract

The model presented combines a detailed determination of the temperature increase by pulsed laser irradiation of a solid with calculations of thermodesorption in the presence of a gas phase. It is applied to the etching of silicon dioxide by a CO 2 laser and fluorocontaining compounds. The applicability of some usual approximations (surface heat source, temperature-independent properties of the solid) and the effect of various parameters of the laser pulse, of the surface complexes and of the gas phase on the surface temperature and the desorbed amount are discussed. Some indications are given on possible thermal processes during the etching of silicon by CO 2 laser irradiation in the presence of XeF 2.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.