Abstract
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson counter and is called folding counter. Both the theoretical background and practical algorithms are presented to characterize a set of deterministic test cubes by a reasonably small number of seeds for a folding counter. Combined with classical approaches for test width compression and with pseudorandom pattern generation these new techniques provide an efficient and flexible solution for scan-based BIST. Experimental results show that the proposed scheme outperforms previously published approaches based on the reseeding of LFSRs or Johnson counters.
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