A Miniature GaN Chip for Surface Roughness Measurement

Abstract

In this work, we report on the fabrication and characterization of a miniature GaN chip with a size of $1.1\times 1.1\times0.21$ mm3 for surface roughness measurement. Unlike conventional optical metrology that requires external components for the optical coupling between light source and detector, a monolithic GaN-on-sapphire chip fabricated through wafer-scale processes provides light emission and photodetection functions and is capable of sensing a range of average surface roughness from 0.025 to $1.6~\mu \text{m}$ . The sensing performances are compared with fiber-optic metrology, and the ability to real-time monitor the roughness of the moving surface is demonstrated. The novel chip offers the advantage of non-contact and non-destructive, compact structure, simple operation, and in situ measurement capability, which is highly valuable for various practical and industrial surface metrology applications.