A method to significantly lessen the sample contamination of the vacuum interface of an on-axis electrospray ion source by adding a mechanical shutter

Abstract

Rapid Communications in Mass SpectrometryVolume 13, Issue 14 p. 1550-1550 Letter to the Editor A method to significantly lessen the sample contamination of the vacuum interface of an on-axis electrospray ion source by adding a mechanical shutter Jan Axelsson, Jan Axelsson Ion Physics Division, Ångström Laboratory, Uppsala University, Box 534, S-751 21 Uppsala, SwedenSearch for more papers by this authorKristina Håkansson, Kristina Håkansson Ion Physics Division, Ångström Laboratory, Uppsala University, Box 534, S-751 21 Uppsala, SwedenSearch for more papers by this authorMagnus Palmblad, Magnus Palmblad Ion Physics Division, Ångström Laboratory, Uppsala University, Box 534, S-751 21 Uppsala, SwedenSearch for more papers by this authorPer Håkansson, Corresponding Author Per Håkansson Ion Physics Division, Ångström Laboratory, Uppsala University, Box 534, S-751 21 Uppsala, SwedenIon Physics Division, Ångström Laboratory, Uppsala University, Box 534, S-751 21 Uppsala, SwedenSearch for more papers by this author Jan Axelsson, Jan Axelsson Ion Physics Division, Ångström Laboratory, Uppsala University, Box 534, S-751 21 Uppsala, SwedenSearch for more papers by this authorKristina Håkansson, Kristina Håkansson Ion Physics Division, Ångström Laboratory, Uppsala University, Box 534, S-751 21 Uppsala, SwedenSearch for more papers by this authorMagnus Palmblad, Magnus Palmblad Ion Physics Division, Ångström Laboratory, Uppsala University, Box 534, S-751 21 Uppsala, SwedenSearch for more papers by this authorPer Håkansson, Corresponding Author Per Håkansson Ion Physics Division, Ångström Laboratory, Uppsala University, Box 534, S-751 21 Uppsala, SwedenIon Physics Division, Ångström Laboratory, Uppsala University, Box 534, S-751 21 Uppsala, SwedenSearch for more papers by this author First published: 08 July 1999 https://doi.org/10.1002/(SICI)1097-0231(19990730)13:14<1550::AID-RCM651>3.0.CO;2-OCitations: 5AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat No abstract is available for this article.Citing Literature Volume13, Issue1430 July 1999Pages 1550-1550 RelatedInformation