Abstract
A method is described whereby the thickness and magnetization of thin epitaxial magnetic films can be estimated from a measurement of the initial slope of the magnetic flux vs magnetic field curve and the zero-field domain period, respectively. The method is based on an analysis of the parallel-stripe-domain configuration as an approximation to the real domain configuration. Data is shown comparing the calculated thickness to that obtained by optically observing edge polished specimens, for a number of films.
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