A Method of Measuring Capacitance at very High Frequencies and Its Application to the Study of Capacitance of Reverse Biased Semiconductor Diodes

Abstract

A method is described for measuring capacitance at HF and VHF using coaxial cables. The equipment required for this method is normally available even in a moderately equipped electronics laboratory. The method is of wide applicability but is particularly suited to the study of capacitance of reverse biased semiconductor diodes. It is simple and accurate and needs very small r.f. voltages. Results of measurements using this method on same reverse biased diodes are also described.