A Method of Dip Decomposition Common-Reflection-Surface Stack

Abstract

Common reflection surface (CRS) stack is a macro-model independent zero-offset (ZO) imaging method. The traditional CRS stack method is implemented by determination of a set of wavefield attributes by which the CRS operator is constructed, wherein the attributes are searched and optimized automatically by a data-driven strategy such that a high quality ZO section will be simulated by stacking along the optimized CRS operator. However, the data-driven strategy also causes an inevitable “dip-angle discrimination phenomenon” which leads to loss of weak reflections and distortion of kinematical characteristic of the ZO section. In this paper, dip decomposition CRS stack is proposed to handle above problems which makes the CRS stack method more practical.