Abstract
A novel approach to determine conduction mechanisms in complex amorphous materials was presented and tested on a real system. In the first step of the presented method, total electrical admittance of the material is analyzed in order to separate a couple of processes, each of which can be described by Jonscher's universal dielectric response. In the following step, a temperature dependence of dielectric response parameters of the processes is determined and compared with known models of conduction mechanisms in structural amorphous materials. Using this approach, a presence of two different conduction mechanisms describing electrical conductivity in a two-phase glass was described.
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