Abstract

A lot of engineering applications, from telecommunications to power systems, require accurate measurement of phase angles. Some of them, like synchrophasor measurement and calibration of instrument transformers with digital output, in order to reach high phase measurement accuracy, require the knowledge of phase error of digitizers. Therefore, in this paper a method for the measurement of digitizers’ absolute phase errors is proposed. It adopts a sinewave and two square waves, that are the digitizer sample clock and a phase reference signal. Combining the measurements of the relative phase differences between the adopted signals it is possible to accurately evaluate the absolute phase error of a digitizer.

Highlights

  • The knowledge of phase angles of signals is at the base of many engineering applications, from telecommunications to power systems ([1]-[5])

  • In most measurement applications, electronic instrumentation is based on digitizers, to convert analog signals to digital samples, and digital signal processors, to get the desired measurement value

  • An interesting technique for measurement of digitizer absolute phase error is proposed in [14], that involves the generation of a reference signal with known phase with respect to a time reference

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Summary

Introduction

The knowledge of phase angles of signals is at the base of many engineering applications, from telecommunications to power systems ([1]-[5]). There are special applications, such as Phasor Measurement Unit (PMU) ([9], [10]) or calibration of Low Power Instrument Transformers (LPIT) ([11]-[13]) with digital output (having as a reference an instrument transformer with analog output), where high phase accuracies, sometimes in the order of microradians, are required. In these situations, the absolute phase deviation of the single channel of the used digitizer may be comparable or higher than the required accuracy, introducing an unacceptable systematic error that highly influences the measurement result.

Published under licence by IOP Publishing Ltd
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