Abstract
An image simulation program has been developed to quantitatively evaluate transmission electron microscopy (TEM) images of dislocation configurations. It takes into account many beams, includes linear anisotropic elasticity and uses the column approximation. The program simulates the image of 1 to 4 parallel dislocations and their associated planar faults under bright field, dark field and various weak-beam TEM conditions. Simulations of a variety of dislocations are presented here and it is shown that the use of a many-beam calculation is essential in the case of weak-beam identification of weakly dissociated dislocations.
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