A method for measuring the micro-texture information based on transmission electron microscopy

Abstract

Conventional SEM-based micro-texture technique has attracted broad interests in recent years. There is also an important need to develop TEM based micro-texture methods, since it was expected to back up some of the shortages of conventional micro-texture technique. In the present work, a new methodology was proposed for measuring the micro-texture in TEM manually without the assistance of any external commercial attachment. The orientation matrix, which maps uniquely to the Euler angles, was considered the transformation matrix between crystal coordinates and the sample coordinate. By tilting the TEM specimen to a low-index zone axis with a double-tilt sample holder, the crystal coordinates could be drawn based on the acquired diffraction pattern. The transformation matrix between each defined coordinates could be deduced; and the Euler angles were identified accordingly. The micro-texture of a twin lamella in a rolled magnesium sheet was analyzed as an example.