Abstract
A method for measuring strain by analyzing sharpness of Electron Channeling Pattern (ECP) with Image analysis has been newly developed. The relative value of sharpness of first-order pseudo-Kikuchi line in ECP is used as a parameter of strain. Strain change of Fe-3.25%Si alloy single crystal and polycrystal during deformation and recrystallization was analyzed by this method. This method was compared with the conventional methods; hardness and line broadening of X-ray. This method can be used for measuring strain in material with any crystal orientation.
Highlights
It is very important for studying deformation, recovery, recrystallization, texture, fatigue and fracture to know strain in steel or other crystalline material
Fe-3.25%Si alloy single crystal and polycrystal were used as test specimens
Strain change during deformation and recrystallization was analyzed by this method
Summary
**Semiconductor Materials Research Laboratory, Electronics R and D Laboratories, Nippon Steel Corporation, Shimada, Hikari 743, Japan (Received 20 September 1990; Received in final form 10 December 1993). A method for measuring strain by analyzing sharpness of Electron Channeling Pattern (ECP) with Image analysis has been newly developed. The relative value of sharpness of first-order pseudo-Kikuchi line in ECP is used as a parameter of strain. Strain change of Fe-3.25%Si alloy single crystal and polycrystal during deformation and recrystallization was analyzed by this method. This method was compared with the conventional methods; hardness and line broadening of X-ray. This method can be used for measuring strain in material with any crystal orientation
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