Abstract
The surface selectivity of resonance electron Mössbauer spectroscopy with a proportional counter can be improved by detecting sum signals of K-conversion and K-Auger electrons. The probing depth is estimated from the range of K-Auger electrons to be approximately 120 nm in the case of 57Fe Mössbauer measurements. Furthermore, depth-selective Mössbauer spectroscopy (DSMS) for two layers becomes possible by observing the above mentioned spectrum and the conventional resonance electron Mössbauer spectrum, the probing depths of which are 120 nm and 300 nm, respectively. In order to record several Mössbauer spectra simultaneously, as in the case of the DSMS, we used a microcomputer equipped with interface circuits.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
