Abstract
A calculation method for the incident angle dependence of the solar absorptance αS and the temperature dependence of the total hemispherical emittance eH of multilayer films is proposed. The method is based on calculation of αS and eH from optical constants in the wavelength region from 0.25 to 100 μm for thin polymer films and deposited metal. In this paper we provide values of αS in the incident angle region from 0 to 90° and eH in the temperature range from 173.15 to 373.15 K for two-layer samples of aluminum-deposited polyimide film. The results obtained for αS and eH by the present method are compared with experimental results measured by both spectroscopic and calorimetric methods. The calculated results of αS and eH agree well with the experimental results.
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